Characterisation of small embedded two-dimensional defects using multi-view Total Focusing Method imaging algorithm
نویسندگان
چکیده
Abstract Defect characterisation is an essential step of nondestructive testing which aims to determine the shape and size a defect once detected. The imaging algorithm multi-view Total Focusing Method (TFM) has been successfully used accurately defects greater than several times wavelength. However, characterising smaller remains difficult due diffraction limit. This paper introduces as proof concept probabilistic technique where unknown compared against database reference scatterers obtained with ultrasonic model. measured TFM amplitudes act signature. A Bayesian framework retrieve most credibly explain measurements, calculate uncertainties.
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ژورنال
عنوان ژورنال: NDT & E international
سال: 2021
ISSN: ['0963-8695', '1879-1174']
DOI: https://doi.org/10.1016/j.ndteint.2021.102413